Gaya APA
Sc.D., W, H, B. (1983).
TESTED ELECTRONICS TROUBLESHOOTING METHODS (2).
United States of America:
PRENTICE-HALL,INC.
Gaya MLA
Sc.D., Walter, H., Buchsbaum,.
"TESTED ELECTRONICS TROUBLESHOOTING METHODS".
2
United States of America:
PRENTICE-HALL,INC,
1983.
Text.