Gaya APA

Sc.D., W, H, B. (1983). TESTED ELECTRONICS TROUBLESHOOTING METHODS (2). United States of America: PRENTICE-HALL,INC.

Gaya MLA

Sc.D., Walter, H., Buchsbaum,. "TESTED ELECTRONICS TROUBLESHOOTING METHODS". 2 United States of America: PRENTICE-HALL,INC, 1983. Text.